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Adapting an SoC to ATE Concurrent Test Capabilities.

Rainer DorschRamón Huerta RiveraHans-Joachim WunderlichMartin Fischer
Published in: ITC (2002)
Keyphrases
  • artificial intelligence
  • hardware and software
  • real time
  • data mining
  • decision trees
  • digital libraries
  • test data
  • low power
  • statistical tests
  • test suite
  • mutual exclusion
  • hierarchical reinforcement learning