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P. J. vd Wel
Publication Activity (10 Years)
Years Active: 2014-2014
Publications (10 Years): 0
Top Topics
Lower Level
Highly Reliable
Scale Invariant
Database
Top Venues
Microelectron. Reliab.
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Publications
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R. T. H. Rongen
,
R. Roucou
,
P. J. vd Wel
,
F. C. Voogt
,
F. Swartjes
,
Kirsten Weide-Zaage
Reliability of Wafer Level Chip Scale Packages.
Microelectron. Reliab.
54 (9-10) (2014)