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Reliability of Wafer Level Chip Scale Packages.

R. T. H. RongenR. RoucouP. J. vd WelF. C. VoogtF. SwartjesKirsten Weide-Zaage
Published in: Microelectron. Reliab. (2014)
Keyphrases
  • low cost
  • scale space
  • levels of abstraction
  • database
  • high speed
  • higher level
  • lower level
  • highly reliable
  • confidence levels
  • real time
  • power consumption
  • scale invariant