Masahide Miyazaki

Publication Activity (10 Years)

Years Active: 2003-2006
Publications (10 Years): 0

Publications

Masahide Miyazaki, Tomokazu Yoneda, Hideo Fujiwara
A Memory Grouping Method for Reducing Memory BIST Logic of System-on-Chips. IEICE Trans. Inf. Syst. (4) (2006)
Masahide Miyazaki, Tomokazu Yoneda, Hideo Fujiwara
A memory grouping method for sharing memory BIST logic. ASP-DAC (2006)
Masahide Miyazaki, Toshinori Hosokawa, Hiroshi Date, Michiaki Muraoka, Hideo Fujiwara
A DFT Selection Method for Reducing Test Application Time of System-on-Chips. IEICE Trans. Inf. Syst. (3) (2004)
Toshinori Hosokawa, Hiroshi Date, Masahide Miyazaki, Michiaki Muraoka, Hideo Fujiwara
A Method of Test Plan Grouping to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint. Asian Test Symposium (2003)
Masahide Miyazaki, Toshinori Hosokawa, Hiroshi Date, Michiaki Muraoka, Hideo Fujiwara
A DFT Selection Method for Reducing Test Application Time of System-on-Chips. Asian Test Symposium (2003)