A Method of Test Plan Grouping to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint.
Toshinori HosokawaHiroshi DateMasahide MiyazakiMichiaki MuraokaHideo FujiwaraPublished in: Asian Test Symposium (2003)
Keyphrases
- test data
- synthetic data
- matlab simulation
- data sets
- statistical significance
- statistical tests
- prior knowledge
- statistical methods
- database
- data collection
- real time
- training data
- data analysis
- cost function
- dynamic programming
- input data
- information loss
- noisy data
- face recognition
- missing data
- learned rules
- neural network
- decision trees
- prior information
- missing values
- similarity measure
- statistically significant
- preprocessing
- detection method
- training samples
- statistical analysis
- bayesian networks
- data points
- pairwise