A DFT Selection Method for Reducing Test Application Time of System-on-Chips.
Masahide MiyazakiToshinori HosokawaHiroshi DateMichiaki MuraokaHideo FujiwaraPublished in: IEICE Trans. Inf. Syst. (2004)
Keyphrases
- test data
- preprocessing
- dynamic programming
- high accuracy
- detection method
- pairwise
- experimental evaluation
- high precision
- similarity measure
- prior knowledge
- cost function
- computational cost
- classification method
- detection algorithm
- support vector machine
- selection scheme
- segmentation algorithm
- support vector machine svm
- image quality
- classification accuracy
- objective function