A DFT Selection Method for Reducing Test Application Time of System-on-Chips.
Masahide MiyazakiToshinori HosokawaHiroshi DateMichiaki MuraokaHideo FujiwaraPublished in: Asian Test Symposium (2003)
Keyphrases
- high accuracy
- significant improvement
- high precision
- segmentation method
- experimental evaluation
- clustering method
- detection method
- selection scheme
- computational cost
- selection algorithm
- input data
- optimization algorithm
- modeling method
- selection strategy
- test data
- detection algorithm
- neural network
- medical images
- probabilistic model
- cost function
- similarity measure
- image processing