Mary Yvonne Lanzerotti

Publication Activity (10 Years)

Years Active: 2004-2024
Publications (10 Years): 5

Top Topics

Calculation Method

Quantization Error

Multiple Constraints

Signal Detection

Top Venues

IEEE Trans. Aerosp. Electron. Syst.

EURASIP J. Adv. Signal Process.

IBM J. Res. Dev.

Publications

Brett Smith, Mary Yvonne Lanzerotti
Multi-tier dynamic sampling weak RF signal estimation theory. EURASIP J. Adv. Signal Process. 2024 (1) (2024)
Mary Yvonne Lanzerotti, Adaya Queen, Charles Cerny
Quantization error for weak RF simultaneous signal estimation. EURASIP J. Adv. Signal Process. 2023 (1) (2023)
Mary Yvonne Lanzerotti, C. L. Cerny, R. K. Martin
Theoretical phase calculation approach for N simultaneous signals. IEEE Trans. Aerosp. Electron. Syst. 51 (2) (2015)
Mary Yvonne Lanzerotti, C. L. Cerny
Ultraweak simultaneous signal detection with theoretical phase calculation approaches. IEEE Trans. Aerosp. Electron. Syst. 51 (2) (2015)
Mary Yvonne Lanzerotti, C. L. Cerny
Erratum. IEEE Trans. Aerosp. Electron. Syst. 51 (3) (2015)
G. Vernizzi, Mary Yvonne Lanzerotti, J. Kujawski, A. Weatherwax
Topological constraints for E. F. Rent's work on microminiature packaging and circuitry. IBM J. Res. Dev. 58 (2/3) (2014)
Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand
Impact of interconnect length changes on effective materials properties (dielectric constant). SLIP (2007)
Joshua Friedrich, Bradley D. McCredie, Norman K. James, Bill Huott, Brian W. Curran, Eric Fluhr, Gaurav Mittal, Eddie Chan, Yuen H. Chan, Donald W. Plass, Sam G. Chu, Hung Q. Le, Leo Clark, John R. Ripley, Scott A. Taylor, Jack DiLullo, Mary Yvonne Lanzerotti
Design of the Power6 Microprocessor. ISSCC (2007)
Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand
Microminiature packaging and integrated circuitry: The work of E. F. Rent, with an application to on-chip interconnection requirements. IBM J. Res. Dev. 49 (4-5) (2005)
Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand
Predicting interconnect requirements in ultra-large-scale integrated control logic circuitry. SLIP (2005)
Gerald G. Lopez, Giovanni Fiorenza, Thomas J. Bucelot, Phillip J. Restle, Mary Yvonne Lanzerotti
Characterization of the impact of interconnect design on the capacitive load driven by a global clock distribution. ACM Great Lakes Symposium on VLSI (2005)
Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand
Interpretation of rent's rule for ultralarge-scale integrated circuit designs, with an application to wirelength distribution models. IEEE Trans. Very Large Scale Integr. Syst. 12 (12) (2004)
Mary Yvonne Lanzerotti, Giovanni Fiorenza, Rick A. Rand
Assessment of on-chip wire-length distribution models. IEEE Trans. Very Large Scale Integr. Syst. 12 (10) (2004)