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M. Jablonski
Publication Activity (10 Years)
Years Active: 2013-2015
Publications (10 Years): 1
Top Topics
Multiscale
Reliability Analysis
Free Space
Geometric Structure
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Publications
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Michal Jablonski
,
Riccardo Lucchini
,
Frederick Bossuyt
,
Thomas Vervust
,
Jan Vanfleteren
,
J. W. C. DeVries
,
Pasquale Vena
,
Mario Gonzalez
Impact of geometry on stretchable meandered interconnect uniaxial tensile extension fatigue reliability.
Microelectron. Reliab.
55 (1) (2015)
Michal Jablonski
,
Frederick Bossuyt
,
Jan Vanfleteren
,
Thomas Vervust
,
H. de Vries
Reliability of a stretchable interconnect utilizing terminated, in-plane meandered copper conductor.
Microelectron. Reliab.
53 (7) (2013)