Kouhei Ohtani

Publication Activity (10 Years)

Years Active: 2003-2017
Publications (10 Years): 1

Top Topics

Bayesian Networks

Defect Detection

Top Venues

Publications

Kouhei Ohtani, Naho Osato, Masaki Hashizume, Hiroyuki Yotsuyanagi, Shyue-Kung Lu
A defect level monitor of resistive open defect at interconnects in 3D ICs by injected charge volume. ISCIT (2017)
Satoshi Ohtake, Kouhei Ohtani, Hideo Fujiwara
A Method of Test Generation fo Path Delay Faults Using Stuck-at Fault Test Generation Algorithms. DATE (2003)