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A defect level monitor of resistive open defect at interconnects in 3D ICs by injected charge volume.

Kouhei OhtaniNaho OsatoMasaki HashizumeHiroyuki YotsuyanagiShyue-Kung Lu
Published in: ISCIT (2017)
Keyphrases
  • defect detection
  • real time
  • artificial intelligence
  • expert systems
  • higher level
  • monitoring system
  • database
  • data sets
  • real world
  • learning algorithm
  • bayesian networks
  • information technology