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Junichi Tsukada
Publication Activity (10 Years)
Years Active: 2010-2015
Publications (10 Years): 1
Top Topics
Wavelet Decomposition
Denoising
Multiple Input
Technological Advances
Top Venues
IEICE Trans. Electron.
ICICDT
ESSDERC
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Publications
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Wataru Mizubayashi
,
Takahiro Mori
,
Koichi Fukuda
,
Yongxun Liu
,
Takashi Matsukawa
,
Yuki Ishikawa
,
Kazuhiko Endo
,
Shin-ichi O'Uchi
,
Junichi Tsukada
,
Hiromi Yamauchi
,
Yukinori Morita
,
Shinji Migita
,
Hiroyuki Ota
,
Meishoku Masahara
PBTI for N-type tunnel FinFETs.
ICICDT
(2015)
Wataru Mizubayashi
,
Koichi Fukuda
,
Takahiro Mori
,
Kazuhiko Endo
,
Yongxun Liu
,
Takashi Matsukawa
,
Shin-ichi O'Uchi
,
Yuki Ishikawa
,
Shinji Migita
,
Yukinori Morita
,
Akihito Tanabe
,
Junichi Tsukada
,
Hiromi Yamauchi
,
Meishoku Masahara
,
Hiroyuki Ota
Guidelines for symmetric threshold voltage in tunnel FinFETs with single and dual metal gate electrodes.
ESSDERC
(2013)
Hideo Sakai
,
Shin-ichi O'Uchi
,
Takashi Matsukawa
,
Kazuhiko Endo
,
Yongxun Liu
,
Junichi Tsukada
,
Yuki Ishikawa
,
Tadashi Nakagawa
,
Toshihiro Sekigawa
,
Hanpei Koike
,
Kunihiro Sakamoto
,
Meishoku Masahara
,
Hiroki Ishikuro
High-Frequency Precise Characterization of Intrinsic FinFET Channel.
IEICE Trans. Electron.
(4) (2012)
Shin-ichi O'Uchi
,
Kazuhiko Endo
,
Takashi Matsukawa
,
Yongxun Liu
,
Tadashi Nakagawa
,
Yuki Ishikawa
,
Junichi Tsukada
,
Hiromi Yamauchi
,
Toshihiro Sekigawa
,
Hanpei Koike
,
Kunihiro Sakamoto
,
Meishoku Masahara
A 0.7-V Opamp in Scaled Low-Standby-Power FinFET Technology.
IEICE Trans. Electron.
(4) (2012)
Shin-ichi O'Uchi
,
Kazuhiko Endo
,
Yongxun Liu
,
Tadashi Nakagawa
,
Takashi Matsukawa
,
Yuki Ishikawa
,
Junichi Tsukada
,
Toshihiro Sekigawa
,
Hanpei Koike
,
Kunihiro Sakamoto
,
Meishoku Masahara
Realization of 0.7-V analog circuits by adaptive-Vt operation of FinFET.
CICC
(2010)
Shin-ichi O'Uchi
,
Kazuhiko Endo
,
Yongxun Liu
,
Tadashi Nakagawa
,
Takashi Matsukawa
,
Yuki Ishikawa
,
Junichi Tsukada
,
Hiromi Yamauchi
,
Toshihiro Sekigawa
,
Hanpei Koike
,
Kunihiro Sakamoto
,
Meishoku Masahara
0.5V FinFET SRAM with dynamic threshold control of pass gates for salvaging malfunctioned bits.
ESSCIRC
(2010)