High-Frequency Precise Characterization of Intrinsic FinFET Channel.
Hideo SakaiShin-ichi O'UchiTakashi MatsukawaKazuhiko EndoYongxun LiuJunichi TsukadaYuki IshikawaTadashi NakagawaToshihiro SekigawaHanpei KoikeKunihiro SakamotoMeishoku MasaharaHiroki IshikuroPublished in: IEICE Trans. Electron. (2012)