0.5V FinFET SRAM with dynamic threshold control of pass gates for salvaging malfunctioned bits.

Shin-ichi O'Uchi Kazuhiko Endo Yongxun Liu Tadashi Nakagawa Takashi Matsukawa Yuki Ishikawa Junichi Tsukada Hiromi Yamauchi Toshihiro Sekigawa Hanpei Koike Kunihiro Sakamoto Meishoku Masahara

Published in: ESSCIRC (2010)

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