Jifa Hao

Publication Activity (10 Years)

Years Active: 2013-2022
Publications (10 Years): 6

Top Topics

Highly Reliable

Quantum Genetic Algorithm

Top Venues

Microelectron. Reliab.

Publications

Daniel Beckmeier, Jifa Hao, Jake Choi, Matt Ring
Revealing stresses for plasma induced damage detection in thick oxides. IRPS (2022)
Amartya Ghosh, Osama O. Awadelkarim, Jifa Hao, Samia A. Suliman, Xinyu Wang
Comparison of AC and DC BTI in SiC Power MOSFETs. IRPS (2022)
Jifa Hao, Yuhang Sun, Amartya Ghosh
Charge pumping source-drain current for gate oxide interface trap density in MOSFETs and LDMOS. IRPS (2021)
Amartya Ghosh, Jifa Hao, Michael Cook, Chris Kendrick, Samia A. Suliman, Gavin D. R. Hall, Tom Kopley, Osama O. Awadelkarim
Studies of Bias Temperature Instabilities in 4H-SiC DMOSFETs. IRPS (2020)
Jifa Hao, Amartya Ghosh, Mark Rinehimer, Joe Yedinak, Muhammad A. Alam
BVDSS (drain to source breakdown voltage) instability in shielded gate trench power MOSFETs. IRPS (2018)
Jifa Hao
Hot carrier reliability in LDMOS devices. ASICON (2017)
Jifa Hao, Mark Rioux, Samia A. Suliman, Osama O. Awadelkarim
High temperature bias-stress-induced instability in power trench-gated MOSFETs. Microelectron. Reliab. 54 (2) (2014)
Jifa Hao, T. E. Kopley
Building-in reliability in BCD (Bipolar-CMOS-DMOS) technologies. ASICON (2013)