BVDSS (drain to source breakdown voltage) instability in shielded gate trench power MOSFETs.
Jifa HaoAmartya GhoshMark RinehimerJoe YedinakMuhammad A. AlamPublished in: IRPS (2018)
Keyphrases
- low voltage
- leakage current
- power management
- power consumption
- cmos technology
- power losses
- reactive power
- power system
- electrical power
- design considerations
- power dissipation
- low power
- energy dissipation
- short circuit
- power grid
- thin film
- single phase
- steady state
- field effect transistors
- energy consumption
- nano scale
- genetic algorithm