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High temperature bias-stress-induced instability in power trench-gated MOSFETs.
Jifa Hao
Mark Rioux
Samia A. Suliman
Osama O. Awadelkarim
Published in:
Microelectron. Reliab. (2014)
Keyphrases
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high temperature
power consumption
neural network
data sets
machine learning
databases
e learning
diesel engine