Mark Rioux

Publication Activity (10 Years)

Years Active: 2014-2014
Publications (10 Years): 0

Top Topics

High Temperature

Top Venues

Microelectron. Reliab.

Publications

Jifa Hao, Mark Rioux, Samia A. Suliman, Osama O. Awadelkarim
High temperature bias-stress-induced instability in power trench-gated MOSFETs. Microelectron. Reliab. 54 (2) (2014)