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Jie Xiao
ORCID
Publication Activity (10 Years)
Years Active: 2022-2024
Publications (10 Years): 7
Top Topics
Parallel Computing
Attribute Selection
Cold Standby
Processing Units
Top Venues
IEEE Trans. Computers
IEEE Trans. Reliab.
Int. J. Intell. Syst.
ACM Trans. Design Autom. Electr. Syst.
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Publications
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Zhanhui Shi
,
Jie Xiao
,
Weidong Zhu
,
Jianhui Jiang
A Reliability-Critical Path Identifying Method With Local and Global Adjacency Probability Matrix in Combinational Circuits.
IEEE Trans. Computers
73 (1) (2024)
Jie Xiao
,
Yingying Ge
,
Ru Wang
,
Jungang Lou
ICP-RL: Identifying Critical Paths for Fault Diagnosis Using Reinforcement Learning.
ACM Trans. Design Autom. Electr. Syst.
29 (1) (2024)
Jie Xiao
,
Yujian Yang
,
Haixia Long
,
Rongzhen Qin
,
Jungang Lou
Estimating Redundancy-Reliability of CNNs Based on Strip-Median Attributes.
IEEE Trans. Very Large Scale Integr. Syst.
31 (10) (2023)
Jie Xiao
,
Weidong Zhu
,
Qing Shen
,
Haixia Long
,
Jungang Lou
A Pruning and Feedback Strategy for Locating Reliability-Critical Gates in Combinational Circuits.
IEEE Trans. Reliab.
72 (3) (2023)
Jie Xiao
,
Qiou Ji
,
Qing Shen
,
Jianhui Jiang
,
Yujiao Huang
,
Jungang Lou
Accelerating stochastic-based reliability estimation for combinational circuits at RTL using GPU parallel computing.
Int. J. Intell. Syst.
37 (11) (2022)
Jie Xiao
,
Zhanhui Shi
,
Xuhua Yang
,
Jungang Lou
BM-RCGL: Benchmarking Approach for Localization of Reliability-Critical Gates in Combinational Logic Blocks.
IEEE Trans. Computers
71 (5) (2022)
Jie Xiao
,
Wenbo Chen
,
Jungang Lou
,
Jianhui Jiang
,
Qianwei Zhou
Identifying Reliability-Critical Primary Inputs of Combinational Circuits Based on the Model of Gate-Sensitive Attributes.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
41 (11) (2022)