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Identifying Reliability High-Correlated Gates of Logic Circuits With Pearson Correlation Coefficient.
Zhanhui Shi
Jie Xiao
Jianhui Jiang
Ying Zhang
Yuhao Zhou
Published in:
IEEE Trans. Circuits Syst. II Express Briefs (2024)
Keyphrases
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logic circuits
pearson correlation coefficient
low power
functional decomposition
gate array
highly correlated
logic synthesis
tunnel diode
high speed
power consumption
collaborative filtering
low cost
digital signal processing