Zhanhui Shi

Publication Activity (10 Years)

Years Active: 2018-2024
Publications (10 Years): 8

Top Topics

Top Venues

IEEE Trans. Computers

IEEE Trans. Circuits Syst. II Express Briefs

J. Comput. Sci. Technol.

Publications

Zhanhui Shi, Jie Xiao, Weidong Zhu, Jianhui Jiang
A Reliability-Critical Path Identifying Method With Local and Global Adjacency Probability Matrix in Combinational Circuits. IEEE Trans. Computers 73 (1) (2024)
Zhanhui Shi, Jie Xiao, Jianhui Jiang, Ying Zhang, Yuhao Zhou
Identifying Reliability High-Correlated Gates of Logic Circuits With Pearson Correlation Coefficient. IEEE Trans. Circuits Syst. II Express Briefs 71 (4) (2024)
Zhanhui Shi, Jie Xiao, Jianhui Jiang, Ying Zhang, Yuhao Zhou
ARA-RCIV: Identifying Reliability-Critical Input Vectors of Logic Circuits Based on the Association Rules Analysis Approach. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43 (8) (2024)
Weidong Zhu, Jianhui Jiang, Zhanhui Shi
Locating Critical-Reliability Gates for Sequential Circuits based on the Time Window Graph Model. ATS (2022)
Jie Xiao, Zhanhui Shi, Xuhua Yang, Jungang Lou
BM-RCGL: Benchmarking Approach for Localization of Reliability-Critical Gates in Combinational Logic Blocks. IEEE Trans. Computers 71 (5) (2022)
Jie Xiao, Zhanhui Shi, Jianhui Jiang, Xu-Hua Yang, Yujiao Huang, Haigen Hu
A Locating Method for Reliability-Critical Gates with a Parallel-Structured Genetic Algorithm. J. Comput. Sci. Technol. 34 (5) (2019)
Jie Xiao, Weifeng Ma, Jungang Lou, Jianhui Jiang, Yujiao Huang, Zhanhui Shi, Qing Shen, Xuhua Yang
Circuit reliability prediction based on deep autoencoder network. Neurocomputing 370 (2019)
Jie Xiao, Jianhui Jiang, Xiaoxin Li, Yujiao Huang, Xuhua Yang, Zhanhui Shi, Jungang Lou
A Novel Trust Evaluation Method for Logic Circuits in IoT Applications Based on the E-PTM Model. IEEE Access 6 (2018)