Locating Critical-Reliability Gates for Sequential Circuits based on the Time Window Graph Model.

Weidong Zhu Jianhui Jiang Zhanhui Shi

Published in: ATS (2022)

Keyphrases

graph model
logic circuits
graph representation
bipartite graph
neighborhood structure
graph partitioning
graph structure
weighted graph
vector space model
language model
clustering method
learning algorithm
training data
vector space