Huimin Xie

Publication Activity (10 Years)

Years Active: 2002-2020
Publications (10 Years): 5

Top Topics

Predictive Control

High Temperature

Top Venues

Microelectron. Reliab.

Publications

Huimin Xie, Xinghai Xu, Yuling Li, Wenjing Hong, Jia Shi
Model Predictive Control Guided Reinforcement Learning Control Scheme. IJCNN (2020)
Sen Jia, Huimin Xie, Xianglong Deng
Extended Morphological Profile-based Gabor Wavelets for Hyperspectral Image Classification. ICPR (2018)
Sen Jia, Huimin Xie, Lin Deng, Qiang Huang, Jun Li
Gabor feature based support vector guided dictionary learning for hyperspectral image classification. IGARSS (2017)
Sen Jia, Bin Deng, Huimin Xie, Lin Deng
A Gabor feature fusion framework for hyperspectral imagery classification. ICIP (2017)
Sen Jia, Huimin Xie, Lin Deng, Linlin Shen
Gabor phase feature-based hyperspectral imagery classification. ICME (2017)
Qinghua Wang, Satoshi Kishimoto, Huimin Xie, Zhanwei Liu, Xinhao Lou
In situ high temperature creep deformation of micro-structure with metal film wire on flexible membrane using geometric phase analysis. Microelectron. Reliab. 53 (4) (2013)
Huimin Xie, Satoshi Kishimoto, Yanjie Li, Qingjun Liu, Yapu Zhao
Fabrication of micro-moiré gratings on a strain sensor structure for deformation analysis with micro-moiré technique. Microelectron. Reliab. 49 (7) (2009)
Qiang Li, Huimin Xie
Finite automata for testing composition-based reconstructibility of sequences. J. Comput. Syst. Sci. 74 (5) (2008)
Zhanwei Liu, Huimin Xie, Daining Fang, Changzhi Gu, Yonggang Meng, Weining Wang, Yan Fang, Jianmin Miao
Deformation analysis in microstructures and micro-devices. Microelectron. Reliab. 47 (12) (2007)
Huimin Xie, Bailin Hao
Visualization of K -Tuple Distribution in Procaryote Complete Genomes and Their Randomized Counterparts. CSB (2002)
Huimin Xie, Anand K. Asundi, Chai Gin Boay, Lu Yunguang, Jin Yu, Zhaowei Zhong, Bryan K. A. Ngoi
High resolution AFM scanning Moiré method and its application to the micro-deformation in the BGA electronic package. Microelectron. Reliab. 42 (8) (2002)