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High resolution AFM scanning Moiré method and its application to the micro-deformation in the BGA electronic package.
Huimin Xie
Anand K. Asundi
Chai Gin Boay
Lu Yunguang
Jin Yu
Zhaowei Zhong
Bryan K. A. Ngoi
Published in:
Microelectron. Reliab. (2002)
Keyphrases
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cost function
experimental evaluation
high precision
computational complexity
preprocessing
support vector machine
detection method
computer vision
similarity measure
high quality
clustering method
neural network
face recognition
high resolution
motion estimation
high accuracy