Hideyuki Iwata

Publication Activity (10 Years)

Years Active: 2005-2018
Publications (10 Years): 2

Top Topics

Information Space

Interface Design

Higher Dimensional

Top Venues

IEICE Trans. Commun.

Publications

Hideyuki Iwata, Yuji Inoue
Expansion of Optical Access Network to Rural Area. IEICE Trans. Commun. (4) (2018)
Monica Perusquía-Hernández, Takahisa Enomoto, Tiago Martins, Mai Otsuki, Hideyuki Iwata, Kenji Suzuki
Embodied interface for levitation and navigation in a 3D large space. AH (2017)
H. Oshiyama, Toshihiro Matsuda, K. Suzuki, Hideyuki Iwata, Takashi Ohzone
independent temperature sensor circuit with scaled CMOS process. ASP-DAC (2009)
Toshihiro Matsuda, Shinsuke Ishimaru, Shingo Nohara, Hideyuki Iwata, Kiyotaka Komoku, Takayuki Morishita, Takashi Ohzone
Current-Voltage Hysteresis Characteristics in MOS Capacitors with Si-Implanted Oxide. IEICE Trans. Electron. (12) (2009)
Toshihiro Matsuda, Yuya Sugiyama, Keita Nohara, Kazuhiro Morita, Hideyuki Iwata, Takashi Ohzone, Takayuki Morishita, Kiyotaka Komoku
A Test Structure for Asymmetry and Orientation Dependence Analysis of CMOSFETs. IEICE Trans. Electron. (8) (2008)
Takashi Ohzone, Eiji Ishii, Takayuki Morishita, Kiyotaka Komoku, Toshihiro Matsuda, Hideyuki Iwata
A Test Structure to Analyze Electrical CMOSFET Reliabilities between Center and Edge along the Channel Width. IEICE Trans. Electron. (2) (2007)
Takashi Ohzone, Tatsuaki Sadamoto, Takayuki Morishita, Kiyotaka Komoku, Toshihiro Matsuda, Hideyuki Iwata
A CMOS Temperature Sensor Circuit. IEICE Trans. Electron. (4) (2007)
Takashi Ohzone, Kazuhiko Okada, Takayuki Morishita, Kiyotaka Komoku, Toshihiro Matsuda, Hideyuki Iwata
A Test Structure to Analyze Highly-Doped-Drain and Lightly-Doped-Drain in CMOSFET. IEICE Trans. Electron. (9) (2006)
Toshihiro Matsuda, Ryuichi Minami, Akira Kanamori, Hideyuki Iwata, Takashi Ohzone, Shinya Yamamoto, Takashi Ihara, Shigeki Nakajima
A Temperature and Supply Voltage Independent CMOS Voltage Reference Circuit. IEICE Trans. Electron. (5) (2005)
Toshihiro Matsuda, Hiroaki Takeuchi, Akira Muramatsu, Hideyuki Iwata, Takashi Ohzone, Kyoji Yamashita, Norio Koike, Ken-ichiro Tatsuuma
A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission. IEICE Trans. Electron. (5) (2005)