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A Test Structure to Analyze Electrical CMOSFET Reliabilities between Center and Edge along the Channel Width.

Takashi OhzoneEiji IshiiTakayuki MorishitaKiyotaka KomokuToshihiro MatsudaHideyuki Iwata
Published in: IEICE Trans. Electron. (2007)
Keyphrases
  • database
  • edge detection
  • test cases
  • test data
  • multi channel