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A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission.

Toshihiro MatsudaHiroaki TakeuchiAkira MuramatsuHideyuki IwataTakashi OhzoneKyoji YamashitaNorio KoikeKen-ichiro Tatsuuma
Published in: IEICE Trans. Electron. (2005)
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