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A Test Structure for Asymmetry and Orientation Dependence Analysis of CMOSFETs.

Toshihiro MatsudaYuya SugiyamaKeita NoharaKazuhiro MoritaHideyuki IwataTakashi OhzoneTakayuki MorishitaKiyotaka Komoku
Published in: IEICE Trans. Electron. (2008)
Keyphrases
  • databases
  • data analysis
  • structural analysis
  • real time
  • real world
  • genetic algorithm
  • statistical analysis
  • quantitative analysis
  • statistical tests