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A Test Structure to Analyze Highly-Doped-Drain and Lightly-Doped-Drain in CMOSFET.
Takashi Ohzone
Kazuhiko Okada
Takayuki Morishita
Kiyotaka Komoku
Toshihiro Matsuda
Hideyuki Iwata
Published in:
IEICE Trans. Electron. (2006)
Keyphrases
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data structure
early warning
tree structure
structural information
database
real time
neural network
artificial intelligence
computer vision
information systems
clustering algorithm
structural properties
room temperature