Guangxing Wan

Publication Activity (10 Years)

Years Active: 2015-2017
Publications (10 Years): 1

Top Topics

Negatively Affect

Charge Coupled Devices

Differential Equations

Top Venues

Microelectron. J.

Publications

Yongbo Liu, Zhengyong Zhu, Huilong Zhu, Guangxing Wan, Junfeng Li, Chao Zhao
Charge pumping test technique using CMOS ring oscillator on leakage issue. Microelectron. J. 68 (2017)
Guangxing Wan, Tianli Duan, Shuxiang Zhang, Lingli Jiang, Bo Tang, Chao Zhao, Huilong Zhu, Hongyu Yu
Overshoot stress impact on HfO2 high-κ layer dynamic SILC. ASICON (2015)