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Guangxing Wan
Publication Activity (10 Years)
Years Active: 2015-2017
Publications (10 Years): 1
Top Topics
Negatively Affect
Charge Coupled Devices
High Precision
Differential Equations
Top Venues
ASICON
Microelectron. J.
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Publications
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Yongbo Liu
,
Zhengyong Zhu
,
Huilong Zhu
,
Guangxing Wan
,
Junfeng Li
,
Chao Zhao
Charge pumping test technique using CMOS ring oscillator on leakage issue.
Microelectron. J.
68 (2017)
Guangxing Wan
,
Tianli Duan
,
Shuxiang Zhang
,
Lingli Jiang
,
Bo Tang
,
Chao Zhao
,
Huilong Zhu
,
Hongyu Yu
Overshoot stress impact on HfO2 high-κ layer dynamic SILC.
ASICON
(2015)