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Charge pumping test technique using CMOS ring oscillator on leakage issue.
Yongbo Liu
Zhengyong Zhu
Huilong Zhu
Guangxing Wan
Junfeng Li
Chao Zhao
Published in:
Microelectron. J. (2017)
Keyphrases
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low cost
high speed
artificial intelligence
charge coupled devices
delay insensitive
differential equations
statistical tests