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Charge pumping test technique using CMOS ring oscillator on leakage issue.

Yongbo LiuZhengyong ZhuHuilong ZhuGuangxing WanJunfeng LiChao Zhao
Published in: Microelectron. J. (2017)
Keyphrases
  • low cost
  • high speed
  • artificial intelligence
  • charge coupled devices
  • delay insensitive
  • differential equations
  • statistical tests