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Overshoot stress impact on HfO2 high-κ layer dynamic SILC.
Guangxing Wan
Tianli Duan
Shuxiang Zhang
Lingli Jiang
Bo Tang
Chao Zhao
Huilong Zhu
Hongyu Yu
Published in:
ASICON (2015)
Keyphrases
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wide range
dynamic environments
closed loop
dynamically changing
databases
multi layer
real time
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artificial intelligence
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high precision
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negatively affect