Gerhard Pöppel

Publication Activity (10 Years)

Years Active: 2002-2016
Publications (10 Years): 1

Top Topics

Nonnegative Matrix Factorization

Model Order Selection

Analog Circuits

Top Venues

Microelectron. J.

Microelectron. Reliab.

Pattern Recognit. Lett.

Publications

Thomas Siegert, Reinhard Schachtner, Gerhard Pöppel, Elmar Wolfgang Lang
A Nonnegative Tensor Factorization Approach for Three-Dimensional Binary Wafer-Test Data. ICMLA (2016)
Christoph Eichenseer, Gerhard Pöppel, Thomas Mikolajick
Energy monitoring of high dose ion implantation in semiconductors via photocurrent measurement. Microelectron. Reliab. 55 (9-10) (2015)
Christoph Eichenseer, Gerhard Pöppel, Thomas Mikolajick
Localization of temperature sensitive areas on analog circuits. Microelectron. J. 45 (6) (2014)
Reinhard Schachtner, Gerhard Pöppel, Ana Maria Tomé, Carlos García Puntonet, Elmar Wolfgang Lang
A new Bayesian approach to nonnegative matrix factorization: Uniqueness and model order selection. Neurocomputing 138 (2014)
Reinhard Schachtner, Gerhard Pöppel, Ana Maria Tomé, Elmar Wolfgang Lang
A Bayesian approach to the Lee-Seung update rules for NMF. Pattern Recognit. Lett. 45 (2014)
Reinhard Schachtner, Gerhard Pöppel, Elmar Wolfgang Lang
Towards unique solutions of non-negative matrix factorization problems by a determinant criterion. Digit. Signal Process. 21 (4) (2011)
Reinhard Schachtner, Gerhard Pöppel, Elmar Wolfgang Lang
Bayesian extensions of non-negative matrix factorization. CIP (2010)
Reinhard Schachtner, Gerhard Pöppel, Elmar Wolfgang Lang
A Nonnegative Blind Source Separation Model for Binary Test Data. IEEE Trans. Circuits Syst. I Regul. Pap. (7) (2010)
Reinhard Schachtner, Gerhard Pöppel, Elmar Wolfgang Lang
Binary Nonnegative Matrix Factorization Applied to Semi-conductor Wafer Test Sets. ICA (2009)
Reinhard Schachtner, Gerhard Pöppel, Ana Maria Tomé, Elmar Wolfgang Lang
Minimum Determinant Constraint for Non-negative Matrix Factorization. ICA (2009)
Reinhard Schachtner, Gerhard Pöppel, Elmar Wolfgang Lang
Nonnegative Matrix Factorization for Binary Data to Extract Elementary Failure Maps from Wafer Test Images. GfKl (2008)
Tobias Rohatsch, Gerhard Pöppel, Heinrich Werner
Robuste Indizes für Projection Pursuit. Inform. Forsch. Entwickl. 17 (2) (2002)