Binary Nonnegative Matrix Factorization Applied to Semi-conductor Wafer Test Sets.

Reinhard Schachtner Gerhard Pöppel Elmar Wolfgang Lang

Published in: ICA (2009)

Keyphrases

test set
nonnegative matrix factorization
error rate
matrix factorization
negative matrix factorization
probabilistic latent semantic indexing
machine learning
test cases
information retrieval
relational databases
email
object oriented
sparsity constraints