Nonnegative Matrix Factorization for Binary Data to Extract Elementary Failure Maps from Wafer Test Images.
Reinhard SchachtnerGerhard PöppelElmar Wolfgang LangPublished in: GfKl (2008)
Keyphrases
- test images
- binary data
- nonnegative matrix factorization
- negative matrix factorization
- ground truth
- natural images
- data representation
- matrix factorization
- sparse representation
- categorical data
- high dimensional
- least squares
- formal concept analysis
- spectral clustering
- face images
- data sets
- principal component analysis
- continuous data
- low resolution
- image regions
- training set
- original data
- database
- document clustering
- high resolution
- objective function
- machine learning
- collaborative filtering
- text categorization
- denoising
- higher order
- pattern recognition
- feature selection
- low dimensional
- dimensionality reduction