A Nonnegative Tensor Factorization Approach for Three-Dimensional Binary Wafer-Test Data.
Thomas SiegertReinhard SchachtnerGerhard PöppelElmar Wolfgang LangPublished in: ICMLA (2016)
Keyphrases
- test data
- tensor factorization
- three dimensional
- matrix factorization
- negative matrix factorization
- training data
- collaborative filtering
- tag recommendation
- test cases
- test set
- data sets
- nonnegative matrix factorization
- gaussian processes
- factorization method
- link prediction
- training set
- linear algebra
- kl divergence
- probabilistic latent semantic analysis
- document clustering
- gaussian process
- low rank
- kernel methods
- high dimensional
- face recognition
- image sequences
- computer vision