Feifei He

Publication Activity (10 Years)

Years Active: 2010-2023
Publications (10 Years): 10

Top Topics

Quantum Inspired

Top Venues

Electron. Commer. Res.

J. Electron. Test.

Publications

Ruihua Zhang, Meng Han, Feifei He, Fanxing Meng, Chunpeng Li
A survey of high utility sequential patterns mining methods. J. Intell. Fuzzy Syst. 45 (5) (2023)
Feifei He, Chunhua Sun, Ye-Zheng Liu
What social characteristics enhance recommender systems? The effects of network embeddedness and preference heterogeneity. Electron. Commer. Res. 23 (3) (2023)
Youbo Lei, Feifei He, Chen Chen, Yingbin Mo, Sijia Li, Defeng Xie, Haonan Lu
MCAD: Multi-teacher Cross-modal Alignment Distillation for efficient image-text retrieval. CoRR (2023)
Xin Sun, Feifei He, Daowen Qiu, Piotr Kulicki, Mirek Sopek, Meiyun Guo
Distributed Quantum Vote Based on Quantum Logical Operators, a New Battlefield of the Second Quantum Revolution. CoRR (2022)
Xin Sun, Feifei He, Piotr Kulicki, Mirek Sopek
Schrödinger's Ballot: Quantum Information and the Violation of Arrow's Impossibility Theorem. CoRR (2021)
Xin Sun, Feifei He, Mirek Sopek, Meiyun Guo
Schrödinger's Ballot: Quantum Information and the Violation of Arrow's Impossibility Theorem. Entropy 23 (8) (2021)
Xin Sun, Feifei He
A First Step to the Categorical Logic of Quantum Programs. Entropy 22 (2) (2020)
Xin Sun, Feifei He, Quanlong Wang
Impossibility of Quantum Bit Commitment, a Categorical Perspective. Axioms 9 (1) (2020)
Feifei He, Yang Li, Yu-Hang Tang, Jian Ma, Huaiqiu Zhu
Identifying micro-inversions using high-throughput sequencing reads. BMC Genom. 17 (S-1) (2016)
Qian Lin, Haipeng Fu, Feifei He, Qian-Fu Cheng
Interconnect Reliability Analysis for Power Amplifier Based on Artificial Neural Networks. J. Electron. Test. 32 (4) (2016)
Sihan Chen, Cher Ming Tan, Guan Hong Tan, Feifei He
Degradation behavior of high power light emitting diode under high frequency switching. Microelectron. Reliab. 52 (9-10) (2012)
Feifei He, Cher Ming Tan
Electromigration reliability of interconnections in RF low noise amplifier circuit. Microelectron. Reliab. 52 (2) (2012)
Feifei He, Cher Ming Tan
Effect of IC layout on the reliability of CMOS amplifiers. Microelectron. Reliab. 52 (8) (2012)
Feifei He, Cher Ming Tan
Circuit level interconnect reliability study using 3D circuit model. Microelectron. Reliab. 50 (3) (2010)
Feifei He, Cher Ming Tan
Modeling the effect of barrier thickness and low-k dielectric on circuit reliability using 3D model. Microelectron. Reliab. 50 (9-11) (2010)