Electromigration reliability of interconnections in RF low noise amplifier circuit.

Feifei He Cher Ming Tan

Published in: Microelectron. Reliab. (2012)

Keyphrases

high sensitivity
low signal to noise ratio
high noise
signal to noise ratio
noise level
random noise
high speed
signal noise ratio
high density
missing data
high levels
additive noise
radio frequency
noise reduction
high power
relevance feedback
gaussian noise
noise model
highly reliable
noisy data