Modeling the effect of barrier thickness and low-k dielectric on circuit reliability using 3D model.
Feifei HeCher Ming TanPublished in: Microelectron. Reliab. (2010)
Keyphrases
- mathematical model
- probabilistic model
- modeling method
- neural network model
- cost function
- theoretical framework
- simulation model
- formal model
- prediction model
- colored petri nets
- neural network
- circuit design
- modeling framework
- hybrid model
- computational model
- management system
- hidden markov models
- prior knowledge
- objective function