Fabio Disegni

Publication Activity (10 Years)

Years Active: 2019-2023
Publications (10 Years): 4

Top Topics

Write Operations

Memory Subsystem

Power Management

Dynamic Random Access Memory

Top Venues

VLSI Technology and Circuits

Publications

N. Grossier, Fabio Disegni, A. Ventre, A. Barcella, R. Mariani, V. Marino, S. Mazzara, A. Scavuzzo, M. Bansal, B. Soni, A. Anand, S. Banzal, D. Joshi, R. Narwal, M. Niranjani, K. Trivedi, P. Ferreira, Rossella Ranica, L. Vullo, Andreia Cathelin, Alfonso Maurelli, S. Pezzini, M. Peri
ASIL-D automotive-grade microcontroller in 28nm FD-SOI with full-OTA capable 21MB embedded PCM memory and highly scalable power management. VLSI Technology and Circuits (2023)
Marcella Carissimi, Chantal Auricchio, Emanuela Calvetti, Laura Capecchi, M. Torres, Stefano Zanchi, P. Gupta, Riccardo Zurla, Alessandro Cabrini, Daniele Gallinari, Fabio Disegni, Massimo Borghi, E. Palumbo, Andrea Redaelli, Marco Pasotti
An Extended Temperature Range ePCM Memory in 90-nm BCD for Smart Power Applications. ESSCIRC (2022)
Andrea Redaelli, Anna Gandolfo, G. Samanni, E. Gomiero, E. Petroni, Luca Scotti, A. Lippiello, Paolo Mattavelli, J. Jasse, D. Codegoni, A. Serafini, Rossella Ranica, C. Boccaccio, J. Sandrini, R. Berthelon, J. C. Grenier, Olivier Weber, David Turgis, A. Valery, S. Del Medico, V. Caubet, J. P. Reynard, Didier Dutartre, L. Favennec, A. Conte, Fabio Disegni, M. De Tomasi, A. Ventre, M. Baldo, Daniele Ielmini, Alfonso Maurelli, P. Ferreira, Franck Arnaud, F. Piazza, Paolo Cappelletti, R. Annunziata, R. Gonella
Improving Ge-rich GST ePCM reliability through BEOL engineering. ESSDERC (2021)
Marcella Carissimi, Ritesh Mukherjee, Vivek Tyagi, Fabio Disegni, Davide Manfrè, Cesare Torti, Daniele Gallinari, Sandro Rossi, Andrea Gambero, Donatella Brambilla, Paola Zuliani, Riccardo Zurla, Alessandro Cabrini, Guido Torelli, Marco Pasotti, Chantal Auricchio, Emanuela Calvetti, Laura Capecchi, Luigi Croce, Stefano Zanchi, Vikas Rana, Preeti Mishra
2-Mb Embedded Phase Change Memory With 16-ns Read Access Time and 5-Mb/s Write Throughput in 90-nm BCD Technology for Automotive Applications. ESSCIRC (2019)