Canhui Zhan

Publication Activity (10 Years)

Years Active: 2015-2022
Publications (10 Years): 4

Top Topics

Cmos Technology

Negative Impact

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Tinghuan Chen, Qi Sun, Canhui Zhan, Changze Liu, Huatao Yu, Bei Yu
Deep H-GCN: Fast Analog IC Aging-Induced Degradation Estimation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (7) (2022)
Tinghuan Chen, Qi Sun, Canhui Zhan, Changze Liu, Huatao Yu, Bei Yu
Analog IC Aging-induced Degradation Estimation via Heterogeneous Graph Convolutional Networks. ASP-DAC (2021)
Pengpeng Ren, Changze Liu, Sanping Wan, Jiayang Zhang, Zhuoqing Yu, Nie Liu, Yongsheng Sun, Runsheng Wang, Canhui Zhan, Zhenghao Gan, Waisum Wong, Yu Xia, Ru Huang
New insights into the HCI degradation of pass-gate transistor in advanced FinFET technology. IRPS (2018)
Wei Ye, Yibo Lin, Xiaoqing Xu, Wuxi Li, Yiwei Fu, Yongsheng Sun, Canhui Zhan, David Z. Pan
Placement mitigation techniques for power grid electromigration. ISLPED (2017)
Yongsheng Sun, Canhui Zhan, Jianping Guo, Yiwei Fu, Guangming Li, Jun Xia
Localized thermal effect of sub-16nm FinFET technologies and its impact on circuit reliability designs and methodologies. IRPS (2015)