New insights into the HCI degradation of pass-gate transistor in advanced FinFET technology.
Pengpeng RenChangze LiuSanping WanJiayang ZhangZhuoqing YuNie LiuYongsheng SunRunsheng WangCanhui ZhanZhenghao GanWaisum WongYu XiaRu HuangPublished in: IRPS (2018)
Keyphrases
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