C. Trapes

Publication Activity (10 Years)

Years Active: 2003-2005
Publications (10 Years): 0

Publications

C. Trapes, Didier Goguenheim, Alain Bravaix
Experimental extraction of degradation parameters after constant voltage stress and substrate hot electron injection on ultrathin oxides. Microelectron. Reliab. 45 (5-6) (2005)
Alain Bravaix, C. Trapes, Didier Goguenheim, Nathalie Revil, E. Vincent
Carrier injection efficiency for the reliability study of 3.5-1.2 nm thick gate-oxide CMOS technologies. Microelectron. Reliab. 43 (8) (2003)