Bart Keppens

Publication Activity (10 Years)

Years Active: 2001-2007
Publications (10 Years): 0

Publications

Olivier Marichal, Geert Wybo, Benjamin Van Camp, Pieter Vanysacker, Bart Keppens
SCR-based ESD protection in nanometer SOI technologies. Microelectron. Reliab. 47 (7) (2007)
Bart Keppens, Markus P. J. Mergens, Cong Son Trinh, Christian C. Russ, Benjamin Van Camp, Koen G. Verhaege
ESD protection solutions for high voltage technologies. Microelectron. Reliab. 46 (5-6) (2006)
Markus P. J. Mergens, Geert Wybo, Bart Keppens, Benjamin Van Camp, Frederic De Ranter, Koen G. Verhaege, John Armer, Phillip Jozwiak, Christian C. Russ
ESD protection circuit design for ultra-sensitive IO applications in advanced sub-90nm CMOS technologies. ISCAS (2) (2005)
Markus P. J. Mergens, John Armer, Phillip Jozwiak, Bart Keppens, Frederic De Ranter, Koen G. Verhaege, R. Kumar
Active-source-pump (ASP) technique for ESD design window expansion and ultra-thin gate oxide protection in sub-90nm technologies. CICC (2004)
S. Trinh, Markus P. J. Mergens, Koen G. Verhaege, Christian C. Russ, John Armer, Phillip Jozwiak, Bart Keppens, Russ Mohn, G. Taylor, Frederic De Ranter
Multi-finger turn-on circuits and design techniques for enhanced ESD performance and width scaling. Microelectron. Reliab. 43 (9-11) (2003)
Bart Keppens, Vincent De Heyn, M. Natarajan Iyer, Vesselin K. Vassilev, Guido Groeseneken
Significance of the failure criterion on transmission line pulse testing. Microelectron. Reliab. 42 (6) (2002)
Karlheinz Bock, Bart Keppens, Vincent De Heyn, Guido Groeseneken, L. Y. Ching, A. Naem
Influence of gate length on ESD-performance for deep submicron CMOS technology. Microelectron. Reliab. 41 (3) (2001)