Login / Signup

ESD protection solutions for high voltage technologies.

Bart KeppensMarkus P. J. MergensCong Son TrinhChristian C. RussBenjamin Van CampKoen G. Verhaege
Published in: Microelectron. Reliab. (2006)
Keyphrases
  • high voltage
  • data mining
  • operating conditions
  • normal operation
  • genetic algorithm
  • active learning
  • dynamic programming
  • partial discharge