L. Y. Ching

Publication Activity (10 Years)

Years Active: 2001-2001
Publications (10 Years): 0

Publications

Karlheinz Bock, Bart Keppens, Vincent De Heyn, Guido Groeseneken, L. Y. Ching, A. Naem
Influence of gate length on ESD-performance for deep submicron CMOS technology. Microelectron. Reliab. 41 (3) (2001)