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Aymen Moujbani
Publication Activity (10 Years)
Years Active: 2013-2014
Publications (10 Years): 0
Top Topics
Closed Loop
Failure Rate
Electron Beam
Dynamic Characteristics
Top Venues
Microelectron. Reliab.
LASCAS
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Publications
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Kirsten Weide-Zaage
,
Aymen Moujbani
,
Jörg Kludt
Simulation in 3D integration and TSV.
LASCAS
(2014)
Aymen Moujbani
,
Jörg Kludt
,
Kirsten Weide-Zaage
,
Markus Ackermann
,
Verena Hein
,
Lutz Meinshausen
Dynamic simulation of migration induced failure mechanism in integrated circuit interconnects.
Microelectron. Reliab.
53 (9-11) (2013)