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Dynamic simulation of migration induced failure mechanism in integrated circuit interconnects.
Aymen Moujbani
Jörg Kludt
Kirsten Weide-Zaage
Markus Ackermann
Verena Hein
Lutz Meinshausen
Published in:
Microelectron. Reliab. (2013)
Keyphrases
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integrated circuit
dynamic characteristics
input output
dynamic environments
simulation model
computer vision
digital images
space time
failure rate
electron beam