A. Meinertzhagen

Publication Activity (10 Years)

Years Active: 2001-2005
Publications (10 Years): 0

Publications

C. Petit, A. Meinertzhagen, D. Zander, O. Simonetti, M. Fadlallah, T. Maurel
Low voltage SILC and P- and N-MOSFET gate oxide reliability. Microelectron. Reliab. 45 (3-4) (2005)
D. Zander, F. Saigné, A. Meinertzhagen, C. Petit
Contribution of oxide traps on defect creation and LVSILC conduction in ultra thin gate oxide devices. Microelectron. Reliab. 43 (9-11) (2003)
M. Fadlallah, C. Petit, A. Meinertzhagen, Gérard Ghibaudo, M. Bidaud, O. Simonetti, F. Guyader
Influence of nitradation in ultra-thin oxide on the gate current degradation of N and PMOS devices. Microelectron. Reliab. 43 (9-11) (2003)
D. Zander, F. Saigné, A. Meinertzhagen
Creation and thermal annealing of interface states induced by uniform or localized injection in 2.3nm thick oxides. Microelectron. Reliab. 41 (9-10) (2001)
D. Zander, C. Petit, F. Saigné, A. Meinertzhagen
High field stress at and above room temperature in 2.3 nm thick oxides. Microelectron. Reliab. 41 (7) (2001)