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Low voltage SILC and P- and N-MOSFET gate oxide reliability.
C. Petit
A. Meinertzhagen
D. Zander
O. Simonetti
M. Fadlallah
T. Maurel
Published in:
Microelectron. Reliab. (2005)
Keyphrases
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leakage current
low voltage
power line
design considerations
cmos technology
silicon dioxide
power management
electrical properties
pattern recognition